کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9785984 | 1512662 | 2005 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Phase singularities in analytic signal of white-light speckle pattern with application to micro-displacement measurement
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Phase singularities in analytic signal of white-light speckle pattern with application to micro-displacement measurement Phase singularities in analytic signal of white-light speckle pattern with application to micro-displacement measurement](/preview/png/9785984.png)
چکیده انگلیسی
Rather than regarding the phase singularities as obstacles or nuisances in phase unwrapping, we explore new possibilities of making use of the phase singularities in optical metrology. Instead of intensity correlation techniques used in conventional speckle metrology, we propose a new technique of displacement measurement that makes use of the density of phase singularities in the complex analytic signal of the speckle pattern, which is generated by Hilbert filtering. Experimental results and theoretical analysis are presented that demonstrate the validity of the proposed technique.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 248, Issues 1â3, 1 April 2005, Pages 59-68
Journal: Optics Communications - Volume 248, Issues 1â3, 1 April 2005, Pages 59-68
نویسندگان
Wei Wang, Nobuo Ishii, Steen G. Hanson, Yoko Miyamoto, Mitsuo Takeda,