کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9786051 1512664 2005 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
X-ray photon correlation spectroscopy in a reflection geometry: coherence and resolution
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
X-ray photon correlation spectroscopy in a reflection geometry: coherence and resolution
چکیده انگلیسی
In X-ray photon correlation spectroscopy (XPCS) the degree of coherence of the X-ray beam determines the contrast of the observed intensity correlation function. In this article, we present XPCS measurements of smectic liquid crystal membranes in a reflectivity geometry showing that both coherence and resolution can influence the time dependence of the correlation function. Variation of the pre-detector slits as well as of the projected coherence length on the membrane induce a time dependence of the intensity correlation function. We also treat several practical aspects and limitations we encountered during our XPCS studies. Finally the conditions for heterodyne detection at the specular ridge and homodyne detection at off-specular conditions are discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 247, Issues 1–3, 1 March 2005, Pages 111-124
نویسندگان
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