کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9786196 1512668 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Mueller matrix determination for one-dimensional rough surfaces with a reduced number of measurements
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Mueller matrix determination for one-dimensional rough surfaces with a reduced number of measurements
چکیده انگلیسی
We apply the direct method of Mueller Matrix Ellipsometry (MME) to measure the Mueller matrix associated to a one-dimensional (1-D) rough surface. We show that for a 1-D surface, the complete Mueller matrix can be determined with four different intensity measurements, instead of six as actually are reported. The experimental Mueller matrix elements obtained for a 1-D random rough, metallic surface, by the reported method are undistinguishable from the measured by using our method.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 244, Issues 1–6, 3 January 2005, Pages 7-13
نویسندگان
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