کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9796132 | 1514941 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
In situ diffraction profile analysis during tensile deformation motivated by molecular dynamics
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: In situ diffraction profile analysis during tensile deformation motivated by molecular dynamics In situ diffraction profile analysis during tensile deformation motivated by molecular dynamics](/preview/png/9796132.png)
چکیده انگلیسی
Molecular dynamics simulations can provide insight into the slip mechanism at the atomic scale and suggest that in nanocrystalline metals dislocations are nucleated and absorbed by the grain boundaries. However, this technique is limited by very short simulation times. Using suggestions from molecular dynamics, we have developed a new in situ X-ray diffraction technique wherein the profile analysis of several Bragg diffraction peaks during tensile deformation is possible. Combining experiment and careful structural analysis the results confirm the suggestions from atomistic simulations.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: A - Volumes 400â401, 25 July 2005, Pages 329-333
Journal: Materials Science and Engineering: A - Volumes 400â401, 25 July 2005, Pages 329-333
نویسندگان
H. Van Swygenhoven, Ž. BudroviÄ, P.M. Derlet, A.G. Frøseth, S. Van Petegem,