کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9796376 1514946 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Stress heterogeneity of thermally grown polycrystalline nickel oxide layers
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
Stress heterogeneity of thermally grown polycrystalline nickel oxide layers
چکیده انگلیسی
Mechanical properties of NiO films developed at approximately 800 °C in air for 26 h on a 99.9% pure polycrystalline Ni substrates have been investigated by X-ray diffraction, transmission electron microscopy and atomic force microscopy. The oxide layers, 8 μm thick, exhibit a duplex structure with a slight {1 1 1} texture. The average stresses in the oxide films have been deduced by X-ray diffraction to be 330 ± 35 MPa in compression. Detailed analyses of the oxide films performed by atomic force microscopy show surface undulations on the nanometer scale located in some of the grains. These well-defined periodic structures are due to high growth stress heterogeneity from grain to grain in the oxide layer. From a linear analytical model, it is deduced that growth stresses as large as 4 GPa can be developed locally during the high temperature oxidation process as a result of the strong in-plane anisotropy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: A - Volume 395, Issues 1–2, 25 March 2005, Pages 22-26
نویسندگان
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