کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9809527 | 1517712 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electron localization and resonant tunneling in uniform nanocrystalline silicon quantum dot systems
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
In this paper, we review our recent investigation of the electronic transport in hydrogenated nanocrystalline silicon thin film grown on crystalline silicon substrate. The variable magnetic-field Hall measurements have been applied to extract the separated carrier information about the nc-Si:H, c-Si and their interface, where the formation of two-dimensional electron gas is clearly observed. With a decrease in the temperature, the nc-Si:H thin film shows a transition from the extended state to the band-tail state, together with a positive magneto-conductivity at extremely low temperatures. These results reveal the good uniformity of the quantum dots in the nc-Si:H thin film and the electron localization. Furthermore, we have successfully observed clear step-like and spike-like structures for the electrons resonant tunneling through the quasi-2D and 0D states in the I-V curves of the nc-Si:H/c-Si diode under strong electric field at low temperatures.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 198, Issues 1â3, 1 August 2005, Pages 30-35
Journal: Surface and Coatings Technology - Volume 198, Issues 1â3, 1 August 2005, Pages 30-35
نویسندگان
X.Y. Chen, W.Z. Shen,