کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9809968 1517720 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
AFM study of LaNiO3 thin films on various single crystal substrates prepared by using a metal naphthenate precursor
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
AFM study of LaNiO3 thin films on various single crystal substrates prepared by using a metal naphthenate precursor
چکیده انگلیسی
We investigated surface morphology of LaNiO3 thin films on LaAlO3 (100), SrTiO3(100), MgO(100) and sapphire (0001) substrates by using atomic force microscope (AFM). Chemical solution deposition process was adopted to prepare thin film with a metal naphthenate precursor. The power spectral density of thin films on LaAlO3 and SrTiO3 substrates exhibits an inflated shape at a spatial frequency into 10 μm−1 range with uniformly formed small grains, while LaNiO3 on sapphire showed a high root mean square roughness.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 190, Issues 2–3, 21 January 2005, Pages 331-335
نویسندگان
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