کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9816853 1518375 2005 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Surface morphology of self-assembled vertically stacked InAs quantum dots by atomic force microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Surface morphology of self-assembled vertically stacked InAs quantum dots by atomic force microscopy
چکیده انگلیسی
In quantum dots (QDs) three-dimensional confinement of carriers leads to energy level discreteness to exhibit a rich spectrum of phenomena including quantum confinement, exchange splittings, Coulomb blockade, and multiexciton transitions. In this paper, five-period vertically stacked samples with size-controlled growth were grown by molecular-beam epitaxy (MBE) with solid sources, and the surface morphologies of self-assembled vertically stacked InAs quantum dots were characterized by atomic force microscopy (AFM). We described structural and optical properties of vertically aligned InAs QDs embedded in Al0.5Ga0.5As and employed a size-controlled growth procedure for the QDs. The strongly localized electron coupling effect and many-body effect lead to quantum dephase splitting of the ground state energy of the vertically aligned InAs QDs.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 105, Issues 1–4, November 2005, Pages 125-128
نویسندگان
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