کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9816896 | 1518376 | 2005 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Energy-filtered electron-diffracted beam holography
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
A method of energy-filtered electron holography is described where any two electron-diffracted beams can be interfered using an electron biprism. A Gatan image filter is used to select the energy loss of the electrons produced in the holograms. Gallium arsenide is used as the TEM specimen. This method of microscopy confirms that fringes extending beyond a limiting aperture were due to inelastically scattered electrons and specifically electrons scattered from the bulk plasmon. The degree of coherence of the zero-loss and energy-loss electrons were high and measured to be â¼0.3, which was maintained even for the high energy-loss electrons up to 100Â eV. Future systematic studies using this method should help understand the Stobbs factor and contribute to the development of quantitative high-resolution electron microscopy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 104, Issues 3â4, October 2005, Pages 261-270
Journal: Ultramicroscopy - Volume 104, Issues 3â4, October 2005, Pages 261-270
نویسندگان
R.A. Herring,