کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9817991 1518773 2005 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Observation of an HCI-induced nano-dot on an HOPG surface with STM and AFM
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Observation of an HCI-induced nano-dot on an HOPG surface with STM and AFM
چکیده انگلیسی
We have observed highly oriented pyrolytic graphite (HOPG) irradiated with highly charged ions (HCIs) with a scanning probe microscope. The same impact site was observed with both the scanning tunnelling microscope (STM) and atomic force microscope (AFM) modes. In the non-contact mode AFM image, protrusion-like dots have been observed as well as in the STM observations. The dot size (diameter) and height observed with the AFM mode were nearly equal to that with the STM mode. The present observation clearly indicates that an HCI impact induces topographic modification on an HOPG surface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 235, Issues 1–4, July 2005, Pages 452-455
نویسندگان
, , , , , , ,