کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817991 | 1518773 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Observation of an HCI-induced nano-dot on an HOPG surface with STM and AFM
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Observation of an HCI-induced nano-dot on an HOPG surface with STM and AFM Observation of an HCI-induced nano-dot on an HOPG surface with STM and AFM](/preview/png/9817991.png)
چکیده انگلیسی
We have observed highly oriented pyrolytic graphite (HOPG) irradiated with highly charged ions (HCIs) with a scanning probe microscope. The same impact site was observed with both the scanning tunnelling microscope (STM) and atomic force microscope (AFM) modes. In the non-contact mode AFM image, protrusion-like dots have been observed as well as in the STM observations. The dot size (diameter) and height observed with the AFM mode were nearly equal to that with the STM mode. The present observation clearly indicates that an HCI impact induces topographic modification on an HOPG surface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 235, Issues 1â4, July 2005, Pages 452-455
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 235, Issues 1â4, July 2005, Pages 452-455
نویسندگان
Masashi Terada, Nobuyuki Nakamura, Yoichi Nakai, Yasuyuki Kanai, Shunsuke Ohtani, Ken-ichiro Komaki, Yasunori Yamazaki,