کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9818110 | 1518776 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Summary of recent research on gas cluster ion beam process technology
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Gas cluster ion beam (GCIB) process has been studied for more than 15Â years. But the interest in GCIB process has increased only recently, driven by the nano-technology program. Gas cluster ion bombardment have been applied to offer potential for various industrial applications due to its unique characteristics, i.e. the low energy bombardment, lateral sputtering, surface cleaning and smoothing, and low temperature thin film formation. This paper reviews the current fundamental research related to the GCIB-solid interactions as well as their applications in modern magnetic, optical and semiconductor device fabrications.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 232, Issues 1â4, May 2005, Pages 195-199
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 232, Issues 1â4, May 2005, Pages 195-199
نویسندگان
Isao Yamada, Noriaki Toyoda,