کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9821476 | 1518985 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Sims study of Ti-Zr-V NEG thermal activation process
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Two samples of the same Ti:Zr:V stoichiometry were investigated following two different procedures of thermal activation. Step-by-step heating up to 320 °C (as model activation) and direct long time heating to 240 °C (continuous thermal activation) were applied. The SSIMS measurements are highly surface sensitive and reflect changes of the superficial oxide layer covering air-exposed surfaces during activation. To compare the final states of activation, depth profiles of surface layers have been used as well. Molecular ion intensity ratios MX+/M+ (X=O, H; M=Ti, Zr, V) have been considered to be directly coverage-sensitive and were monitored during the processes. The results were checked by comparison to corresponding XPS experiments.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 80, Issues 1â3, 14 October 2005, Pages 47-52
Journal: Vacuum - Volume 80, Issues 1â3, 14 October 2005, Pages 47-52
نویسندگان
J. Drbohlav, I. MatolÃnová, K. MaÅ¡ek, V. MatolÃn,