کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9821593 1518988 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Structural studies on ion-implanted semiconductors using X-ray synchrotron radiation: Strain evolution and growth of nanocrystals
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Structural studies on ion-implanted semiconductors using X-ray synchrotron radiation: Strain evolution and growth of nanocrystals
چکیده انگلیسی
Another important issue is the analysis of nanocrystals. Diamond-SiC heterostructures produced by ion beam synthesis are considered as a promising technique for production of novel devices for high-power applications. Synthesized by ion bombardment nanocrystals that grow in the single crystalline matrix are highly oriented. As revealed by X-ray scattering, size and shape of nanocrystals, as well as incorporated strain depend on the ion implantation parameters.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 78, Issues 2–4, 30 May 2005, Pages 303-309
نویسندگان
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