کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9845036 1645433 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Preliminary radiation tests of 32 μm thick hydrogenated amorphous silicon films
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Preliminary radiation tests of 32 μm thick hydrogenated amorphous silicon films
چکیده انگلیسی
Preliminary radiation tests of hydrogenated amorphous silicon n-i-p photodiodes deposited on a coated glass substrate are presented in this paper. These tests have been performed using a 24 GeV proton beam. We report results on the fluence dependence of the diode dark current and of the signal induced by a proton spill.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 552, Issues 1–2, 21 October 2005, Pages 88-92
نویسندگان
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