کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9845373 1526512 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Fabrication and characterization of thin ΔE detectors for spectroscopic application
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Fabrication and characterization of thin ΔE detectors for spectroscopic application
چکیده انگلیسی
Ultra-thin ΔEdetectors for spectroscopic applications have been fabricated and characterized down to a thickness of 4.5 μm. A common one-side mask aligner was used to fabricate the detectors. The detectors display low leakage current and the resulting capacitance is close to the detector window capacitance below a threshold voltage. The detector telescope needs to be slightly tilted to reduce the probability for channeling. However, even better control of the thickness uniformity is needed to improve the resolution in the ΔE-E detector telescope.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 546, Issues 1–2, 1 July 2005, Pages 312-318
نویسندگان
, , , ,