کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9845624 1526517 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electron beam and laser testing on the novel stripixel detectors
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Electron beam and laser testing on the novel stripixel detectors
چکیده انگلیسی
The novel Si stripixel detector, developed at BNL (Brookhaven National Laboratory), has been applied in the development of a prototype Si strip detector system for the PHENIX Upgrade at RHIC. The Si stripixel detector can generate X-Y two-dimensional (2D) position sensitivity with single-sided processing and readout. Test stripixel detectors with pitches of 85 and 560 μm have been subjected to the electron beam test in a SEM set-up, and to the laser beam test in a lab test fixture with an X-Y-Z table for laser scanning. Test results have shown that the X and Y strips are well isolated from each other, and 2D position sensitivity has been well demonstrated in the novel stripixel detectors.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 541, Issues 1–2, 1 April 2005, Pages 21-28
نویسندگان
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