Keywords: Diamond; Edge termination; Floating metal guard rings; Schottky barrier diode; EBIC; Electrical properties; Field distribution;
مقالات ISI (ترجمه نشده)
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Keywords: Ascophyllum nodosum extract; Tomato; Drought stress; Dehydrin; Osmolytes; Plant biostimulant; Abiotic stress tolerance; 2-ME; 2-mercapthoethanol; ABA; abscisic acid; ANE; Ascophyllum nodosum extract; DW; dry weight; EBIC; European Biostimulant Industry Co
Keywords: Deep diffusion; EBIC; Junction depth; Laser doping;
Profile forward regression screening for ultra-high dimensional semiparametric varying coefficient partially linear models
Keywords: primary; 62G08; secondary; 62J02; Varying coefficient partially linear model; Profile forward regression; Variable screening; Screening consistency property; Ultra-high dimension; EBIC;
Keywords: AE; Acoustic emission; AHP; Analytic hierarchy process; CCD; Charge coupled device; CIGS; Copper-indium-gallium-selenide; DLIT; Dark lock-in thermography; EBIC; Electron beam induced current; EBSD; Electron backscatter diffraction; EDX; Energy-dispersive
Keywords: Diffusion length; Grain boundaries; EBIC; XBIC;
Keywords: Monte-Carlo simulation; EBIC; Nano-electrode; Nanocrystal; Semiconductors;
Keywords: Single contact electron beam induced current; SCEBIC; EBIC; Solar cell; Characterization; PSPICE simulation;
Keywords: EBIC; CdTe; FIB; Grain boundary; Electron beam; Local characterization;
Keywords: KF-PDT; CIGS solar cell; Rinsing; EBIC; XPS
Reducing Zn diffusion in single axial junction InP nanowire solar cells for improved performance
Keywords: InP; Nanowire solar cells; Axial junction; Selective-area MOVPE; CL; EBIC;
Betavoltaic battery performance: Comparison of modeling and experiment
Keywords: Betavoltaics; Ni-63; Semiconductor converter; Monte Carlo simulation; EBIC; Output parameters prediction;
An STM - SEM setup for characterizing photon and electron induced effects in single photovoltaic nanowires
Keywords: STM - SEM; Nanowires; Solar cells; EBIC;
Light-induced changes in the minority carrier diffusion length of Cu(In,Ga)Se2 absorber material
Keywords: CIGS; Metastability; Minority carrier diffusion length; Defects; EBIC; TRPL;
Extended defect study in Si: EBIC versus LBIC
Keywords: EBIC; LBIC; Si; Solar cell; Grain boundary; Dislocation; Dislocation trail;
Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates
Keywords: GaN nanowires; MBE growth; Solar cells; EBIC;
Grain-boundary character distribution and correlations with electrical and optoelectronic properties of CuInSe2 thin films
Keywords: Grain-boundary character distribution; CuInSe2 thin films; EBSD; EBIC; CL;
Defect recognition by means of light and electron probe techniques for the characterization of mc-Si wafers and solar cells
Keywords: mc-Si; qm-Si; Si-Ribbon; LBIC; EBIC; PLi; Raman; GBs; Sub-GBs;
Efficiency enhancement of axial junction InP single nanowire solar cells by dielectric coating
Keywords: III-V semiconductors; Nanowire solar cells; Axial junction; Selective-area MOVPE; EBIC; Dielectric coating;
Anneal treatment to improve the performance of extended wavelength In0.83Ga0.17As photodetectors
Keywords: Extended wavelength; InGaAs; Dark current; Annealing treatment; EBIC;
What is the real value of diffusion length in GaN?
Keywords: Nitride materials; GaN; Electrical transport; Diffusion length; SEM; EBIC;
Nanoprober-based EBIC measurements for nanowire transistor structures
Keywords: EBIC; Nanoprober; Diamond tips
Geometrical control of photocurrent in active Si nanowire devices
Keywords: NW, nanowire; EBIC, Electron Beam Induced Current; I–V, current–voltage; CVD, Chemical Vapor Deposition; VLS, Vapor Liquid SolidNanowires; Absorption; Photocurrent; Photovoltaic devices; Mie resonance; EBIC
Characterization of 4H semi-insulating silicon carbide single crystals using electron beam induced current
Keywords: Electron beam induced current; EBIC; Silicon carbide; Semi-insulating; KOH etching; Dislocations
Characterization of Cu(InGa)Se2 grain boundary properties by electron- and tip-probe methods
Keywords: Cu(InGa)Se2; Grain boundary; EBIC; EBSD; SSRM; TEM
Comparison of charge distributions in CIGS thin-film solar cells with ZnS/(Zn,Mg)O and CdS/i-ZnO buffers
Keywords: CIGS; Thin films; Buffer; CdS; ZnS; (Zn,Mg)O; EBIC; Capacitance; Charge distribution
The effect of electron range on electron beam induced current collection and a simple method to extract an electron range for any generation function
Keywords: EBIC; Charge injection; Electron-beam applications; Generation function; Electron penetration; Semiconductor materials measurements;
Direct measurement of electron beam induced currents in p-type silicon
Keywords: Transmission electron microscopy; EBIC; Carrier transport; Semiconductor
Study of defects and impurities in multicrystalline silicon grown from metallurgical silicon feedstock
Keywords: Metallurgical silicon; Impurities; Gettering; Lifetime; EBIC; Photoluminescence
Recombination at the interface between a metallic precipitate and a semiconductor matrix: Application to the electron-beam-induced-current contrast
Keywords: EBIC; Precipitate; Recombination; Semiconductor-metal boundaries; Space-charge;
EBIC and CL studies of ELOG GaN films
Keywords: ELOG GaN; EBIC; Cathodoluminescence; Dislocation; Diffusion length
Physical phenomena affecting performance and reliability of 4H–SiC bipolar junction transistors
Keywords: SiC; EBIC; BJT; Stacking fault
Monte Carlo simulation of the EBIC collection efficiency of a Schottky nanocontact
Keywords: Monte Carlo simulation; EBIC; Nano Schottky contact; Semiconductors
EBIC/PL investigations of dislocation network produced by silicon wafer direct bonding
Keywords: Bonded wafer; Dislocation network; Bonding interface; EBIC; PL; Electrical barrier; Oxide precipitate; Dislocation conduction; Carrier transport; p-n junction; D1; Inhomogeneity; Bright circular region;
Electron-beam-induced current evidence for room-temperature photoluminescence of silicon pn diode
Keywords: PL; Ion-implantation; EBIC; Dislocation; Silicon-based luminescence;
Carrier lifetime limitation defects in polycrystalline silicon ribbons grown on substrate (RGS)
Keywords: 71.55.Cn; 81.05.CyPolycrystalline silicon; Dislocations; Oxygen precipitation; EBIC; Carrier lifetime
Localisation of the p-n junction in poly-silicon thin-film diodes on glass by high-resolution cross-sectional electron-beam induced current imaging
Keywords: EBIC; electron microscopy; silicon solar cells; thin films; FIB
Characterization of the CdS / Cu(In,Ga)Se2 interface by electron beam induced currents
Keywords: Cu(In,Ga)Se2; EBIC; Carrier collection; Interface; Metastability
EBIC and IBIC Imaging on Polycrystalline CdTe
Keywords: 07.78.+s; 29.40.Wk; 72.20.Jv; 72.40.+w; 72.80.Ey; 73.61.Ga; 78.66.HfPolycrystalline CdTe; EBIC; IBIC; Grain boundaries; Carriers mobility; Carriers lifetime
Interfacial state and potential barrier height associated with grain boundaries in polycrystalline silicon
Keywords: Grain boundary; Polycrystalline silicon; Electrical property; Potential barrier; EBIC; KFM
Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices
Keywords: 68.37.Hk; 72.20.Jv; 81.05.Ea; EBIC; GaN; Diffusion; Dislocations;
Analysis of minority carrier diffusion length in SiC toward high quality epitaxial growth
Keywords: SiC; CVD; Minority carrier diffusion length; EBIC
Electron-beam-induced current imaging for the characterisation of structural defects in Si1−xGex films grown by LE-PECVD
Keywords: SiGe; Virtual layers; EBIC; EPD
Competition between internal and heavy doping gettering options in epi-silicon
Keywords: Si; Gettering; EBIC; DLTS;
An analysis of the factors affecting the alpha parameter used for extracting surface recombination velocity in EBIC measurements
Keywords: EBIC; Surface recombination velocity; Diffusion length
Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon
Keywords: 61.72.Mm; 71.55.Cn; 73.20.Hb; EBIC; EBSD; Grain boundary defects; Elemental semiconductor;
Electron trapping effects in C- and Fe-doped GaN and AlGaN
Keywords: 71.55.Eq; 73.50.Gr; 78.66.Fd; III-Nitrides; Cathodoluminescence; EBIC; Lifetime; Diffusion length;
Electron-beam-induced current study of hydrogen passivation on grain boundaries in multicrystalline silicon: Influence of GB character and impurity contamination
Keywords: 61.72Mm; 71.55Cn; 73.20Hb; 81.40Rs; EBIC; Hydrogen passivation; Grain boundary; Silicon;
Electron beam and laser testing on the novel stripixel detectors
Keywords: 87.66.Sm; Stripixel detector; Alternating pixels; Interleaved pixels; EBIC;
Variabilidad en las indicaciones quirúrgicas de las lesiones intradurales postraumáticas
Keywords: Traumatismo craneoencefálico; Lesiones intradurales postraumáticas; Hematomas postrau-máticos; Indicaciones quirúrgicas; Variabilidad quirúrgica; Head injuries; Posttraumatic intradural lesions; Posttraumatic hematomas; Surgical indications; Surgical