Secondary ion mass spectrometry (SIMS) with Bi3+ primary ions as a sensitive probe of surface structures of heterogeneous catalysts

Secondary ion mass spectrometry (SIMS) with Bi3+ primary ions as a sensitive probe of surface structures of heterogeneous catalysts

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Mass Spectrometry - Volume 433, October 2018, Pages 47-54

Chan Heum Park, Il Hee Kim, Chang Min Choi, Jong Sung Jin, Myoung Choul Choi, Young Dok Kim,