Parameter-dependent third-order nonlinear susceptibility of parabolic InGaN/GaN quantum dots Fulltext Access 5 Pages 2007
Bias-tunable electron–spin polarization in an antiparallel double δδ-magnetic-barrier nanostructure Fulltext Access 5 Pages 2007
Properties of ZnO/Cu/ZnO multilayer films deposited by simultaneous RF and DC magnetron sputtering at different substrate temperatures Fulltext Access 5 Pages 2007
Improving the performance of the organic thin-film transistors with thin insulating lithium fluoride buffer layer Fulltext Access 5 Pages 2007
Surface reconstructions on Sb-irradiated GaAs(0 0 1) formed by molecular beam epitaxy Fulltext Access 5 Pages 2007
Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique Fulltext Access 5 Pages 2007
Smooth indium zinc oxide film prepared by sputtering a In2O3:ZnO=95:5 target Fulltext Access 5 Pages 2007
Integration of interdigital-gated plasma wave device for proximity communication system application Fulltext Access 5 Pages 2007
Novel structure of GaAs-based interdigital-gated HEMT plasma devices for solid-state THz wave amplifier Fulltext Access 5 Pages 2007
From ⋄W to Ω: A simple bounded quiescent reliable broadcast-based transformation Fulltext Access 5 Pages 2007
Degradation behavior of 600 V–200 A IGBT modules under power cycling and high temperature environment conditions Fulltext Access 6 Pages 2007
A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models Fulltext Access 6 Pages 2007
Revisiting power cycling test for better life-time prediction in traction Fulltext Access 6 Pages 2007
Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles Fulltext Access 6 Pages 2007
Measurement of the transient junction temperature in MOSFET devices under operating conditions Fulltext Access 6 Pages 2007
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs Fulltext Access 6 Pages 2007
Characterization and modelling of ageing failures on power MOSFET devices Fulltext Access 6 Pages 2007
Failure modes on low voltage power MOSFETs under high temperature application Fulltext Access 6 Pages 2007
Numerical analysis and comparative study of short circuit stress in IGBTs devices (IR, IXYS) Fulltext Access 6 Pages 2007
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities Fulltext Access 6 Pages 2007
A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation Fulltext Access 6 Pages 2007
Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs Fulltext Access 6 Pages 2007
Analysis of interior degradation of a laser waveguide using an OBIC monitor Fulltext Access 6 Pages 2007
Simulation and fabrication of magnetic rotary microgenerator with multipolar Nd/Fe/B magnet Fulltext Access 6 Pages 2007
Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers Fulltext Access 6 Pages 2007
Metal gates and gate-deposition-induced defects in Ta2O5 stack capacitors Fulltext Access 6 Pages 2007
A voltage calibration technique of electro-optic probing for characterization internal to IC’s chip Fulltext Access 6 Pages 2007
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests Fulltext Access 6 Pages 2007
Performance comparison of channel engineered deep sub-micrometer pseudo SOI n-MOSFETs Fulltext Access 6 Pages 2007
Influence of thermal contact resistance on thermal impedance of microelectronic structures Fulltext Access 6 Pages 2007
Comparison between BSIM4.X and HSPICE flicker noise models in NMOS and PMOS transistors in all operating regions Fulltext Access 6 Pages 2007
Correlating gate sinking and electrical performance of pseudomorphic high electron mobility transistors Fulltext Access 6 Pages 2007
Effect of oval defects in GaAs on the reliability of SiNx metal–insulator–metal capacitors Fulltext Access 6 Pages 2007
On the difference between thermal cycling and thermal shock testing for board level reliability of soldered interconnections Fulltext Access 6 Pages 2007
Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides Fulltext Access 6 Pages 2007
Organic thin film transistors with HfO2 high-k gate dielectric grown by anodic oxidation or deposited by sol–gel Fulltext Access 6 Pages 2007
Effects of bending curvature and text/background color-combinations of e-paper on subjects’ visual performance and subjective preferences under various ambient illuminance conditions Fulltext Access 6 Pages 2007
Characteristics of SiCN microstructures for harsh environment and high-power MEMS applications Fulltext Access 6 Pages 2007
Iterative optimization of tail breaking force of 1 mil wire thermosonic ball bonding processes and the influence of plasma cleaning Fulltext Access 6 Pages 2007
Effect of single crystalline MgO powder treatment of phosphor surface on discharge property of high-Xe AC plasma display panels Fulltext Access 6 Pages 2007
Frequency-dependent light emission and extinction of electroluminescent ZnS:Cu phosphor Fulltext Access 6 Pages 2007
Interaction of CdSe/ZnS quantum dots: Among themselves and with matrices Fulltext Access 6 Pages 2007
Observation threshold of product represented angles and its related factors Fulltext Access 6 Pages 2007
A novel algorithm and FPGA based adaptable architecture for correcting sensor non-uniformities in infrared system Fulltext Access 6 Pages 2007
FPGA architecture for fast parallel computation of co-occurrence matrices Fulltext Access 6 Pages 2007
Digital forensic text string searching: Improving information retrieval effectiveness by thematically clustering search results Fulltext Access 6 Pages 2007
Applying a forensic approach to incident response, network investigation and system administration using Digital Evidence Bags Fulltext Access 6 Pages 2007
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs Fulltext Access 6 Pages 2007
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts Fulltext Access 6 Pages 2007
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy Fulltext Access 6 Pages 2007
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications Fulltext Access 6 Pages 2007
Reliability of interfacial adhesion in a multi-level copper/low-k interconnect structure Fulltext Access 6 Pages 2007
Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements Fulltext Access 6 Pages 2007
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices Fulltext Access 6 Pages 2007
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology Fulltext Access 6 Pages 2007
Reliability of semiconductor lasers used in current communication systems and sensing equipment Fulltext Access 6 Pages 2007
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques Fulltext Access 6 Pages 2007
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach Fulltext Access 6 Pages 2007
Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements Fulltext Access 6 Pages 2007
Prospective development in diffusion barrier layers for copper metallization in LSI Fulltext Access 6 Pages 2007
Two-dimensional model of heat flow in broad-area laser diode: Discussion of the upper boundary condition Fulltext Access 6 Pages 2007
Degradation analysis in asymmetric sampled grating distributed feedback laser diodes Fulltext Access 6 Pages 2007