Passivation of Si-based structures in HCN and KCN solutions
Keywords: 78.55.Qr; 78.66.Jg; 81.16.Pr; 85.40Ls; Silicon; Amorphous materials; Passivation; HCN solution; KCN solution; Photoluminescence; DLTS; Spetroscopic ellipsometry; FTIR;