Keywords: فرزکاری یون متمرکز شده; 5 Mn steel; Focused ion beam milling; In-situ observation; Microstructural evolution; Austenite; Cementite;
مقالات ISI فرزکاری یون متمرکز شده (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: فرزکاری یون متمرکز شده; Epitaxial copper line; Electrical resistivity; Trapezoidal cross-section; Size effect; Line edge roughness; Surface roughness; Surface oxidation; Focused ion beam milling
Keywords: فرزکاری یون متمرکز شده; Bone; Focused ion beam milling; Homogeneous strain state; Micropillars; Unloading; Elastoplasticity;
Ultra-thin engraved 3D taper structure in a crystalline material using FIB
Keywords: فرزکاری یون متمرکز شده; Focused ion beam milling; Sputtering yield; Indium phosphide; Taper structure
Machinability study of high speed steel for focused ion beam (FIB) milling process – An experimental investigation at micron/nano scale
Keywords: فرزکاری یون متمرکز شده; Focused ion beam milling; Material removal rate; Surface roughness; High speed steel
Characterization of impedance biosensing performance of single and nanopore arrays of anodic porous alumina fabricated by focused ion beam (FIB) milling
Keywords: فرزکاری یون متمرکز شده; Nanoporous alumina; Electrochemical Impedance Spectroscopy (EIS); Focused Ion beam milling; Impedance biosensing
Inverse modeling of FIB milling by dose profile optimization
Keywords: فرزکاری یون متمرکز شده; Focused ion beam milling; Inverse modeling; Topography simulation; Sputtering; Pattern formation;
Focused ion beam (FIB)-induced changes in the electrochemical behavior of boron-doped diamond (BDD) electrodes
Keywords: فرزکاری یون متمرکز شده; Boron-doped diamond; Focused ion beam milling; Amorphization; Microelectrode array; Heterogeneous electron transfer; Raman spectroscopy
A critical comparison between XRD and FIB residual stress measurement techniques in thin films
Keywords: فرزکاری یون متمرکز شده; Residual stress; CrN; X-ray diffraction; Focused ion beam milling; Digital image correlation; Numerical calculation
Material composition - Pinning strength correlation in Nb thin films with focused ion beam-milled washboard nanostructures
Keywords: فرزکاری یون متمرکز شده; Superconducting Nb films; Washboard pinning potential; Focused ion beam milling; X-ray spectroscopy;
Photonic crystal structure in Nd:YAG laser crystals
Keywords: فرزکاری یون متمرکز شده; Photonic crystal; Nd:YAG laser crystal; Band gaps; Focused ion beam milling
Transitioning streaming to trapping in DC insulator-based dielectrophoresis for biomolecules
Keywords: فرزکاری یون متمرکز شده; Dielectrophoresis; DNA; Protein; Numerical simulation; Trapping condition; EOF; electroosmotic flow; DEP; dielectrophoresis; iDEP; insulator-based dielectrophoresis; FIBM; focused ion beam milling;
Fabrication and characterization of APT specimens from high dose heavy ion irradiated materials
Keywords: فرزکاری یون متمرکز شده; Atom probe tomography; Ion irradiation; Radiation damage; Focused ion beam milling
Effects of focused ion beam milling on austenite stability in ferrous alloys
Keywords: فرزکاری یون متمرکز شده; Martensitic steels; Serial sectioning; Focused ion beam milling; Electron backscatter diffraction (EBSD)
Dopant profiling of focused ion beam milled semiconductors using off-axis electron holography; reducing artifacts, extending detection limits and reducing the effects of gallium implantation
Keywords: فرزکاری یون متمرکز شده; Dopant profiling; Off-axis electron holography; Focused ion beam milling
Surface amorphization, sputter rate, and intrinsic stresses of silicon during low energy Ga+ focused-ion beam milling
Keywords: فرزکاری یون متمرکز شده; 61.43.Dq; 61.80.Az; 61.80.Jh; 61.82.Fk; 81.40.WxSurface amorphization; Focused ion beam milling; Molecular dynamics; Silicon
Reduction of electrical damage in specimens prepared using focused ion beam milling for dopant profiling using off-axis electron holography
Keywords: فرزکاری یون متمرکز شده; 85.30.De; Off-axis electron holography; Focused ion beam milling; GaAs;
Study and formation of 2D microstructures of sapphire by focused ion beam milling
Keywords: فرزکاری یون متمرکز شده; Focused ion beam milling; Dry etching; Sapphire; Microstructures
Recessed nanoband electrodes fabricated by focused ion beam milling
Keywords: فرزکاری یون متمرکز شده; Nanoelectrode arrays; Nanoband electrodes; Focused ion beam milling; Voltammetry
On the structure–property relationship of sound and hypomineralized enamel
Keywords: فرزکاری یون متمرکز شده; Enamel; Hypomineralization; Elastic modulus and hardness; Focused ion beam milling; Electron microscopy
Characterization of the magnetic properties of a GdBa2Cu3O7/La0.75Sr0.25MnO3 superlattice using off-axis electron holography
Keywords: فرزکاری یون متمرکز شده; 75.47.Lx; 75.70.Cn; 42.40.Kw; Manganite; High-TC superconductor; Superlattice; Cross-sectional sample geometry; Off-axis electron holography; Focused ion beam milling;
A methodology to investigate size scale effects in crystalline plasticity using uniaxial compression testing
Keywords: فرزکاری یون متمرکز شده; Size scale effects; Micro-compression testing; Focused ion beam milling; Nickel superalloys;
Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors
Keywords: فرزکاری یون متمرکز شده; 61.14.Nm; 85.30.Pq; Off-axis electron holography; Focused ion beam milling; Back-side milling; Electrostatic potential; Dopant contrast; Specimen preparation; Charging;