Keywords: پرتو یون متمرکز شده; Focussed ion beam; Implantation damage; Coherent X-ray diffraction; Dislocations; Residual lattice strains;
مقالات ISI پرتو یون متمرکز شده (ترجمه نشده)
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Keywords: پرتو یون متمرکز شده; μ; linear X-ray attenuation coefficient; μXRF; micro-X-ray fluorescence spectroscopy; 2D; two-dimensional; 3D; three-dimensional; A; cross-sectional surface area; BGK; Bhatnagar-Gross-Cook approximation; BIB-SEM; broad ion beam scanning electron mic
Keywords: پرتو یون متمرکز شده; Atom probe tomography; Nanoparticles; Sample preparation; Focussed ion beam;
Keywords: پرتو یون متمرکز شده; Channel optical waveguides; Ion beam irradiation; Focussed ion beam; Er-doped tungsten-tellurite glass; Bismuth germanate; Micro Raman spectroscopy
A study of dislocation transmission through a grain boundary in hcp Ti-6Al using micro-cantilevers
Keywords: پرتو یون متمرکز شده; Microcantilever; Focussed ion beam; Transmission electron microscopy; Grain boundary; Dislocation motion;
Observation of thermally etched grain boundaries with the FIB/TEM technique
Keywords: پرتو یون متمرکز شده; Steel; Thermal etching; Focussed ion beam; Transmission electron microscopy;
Investigation of nano structures on ta-C films made by gallium FIB lithography
Keywords: پرتو یون متمرکز شده; Tetrahedral amorphous carbon; Focussed ion beam; Graphitisation; Nano-structures; van-der-Pauw
Measurement of oxygen transport in La0.8Sr0.2MnO3 perovskite grains
Keywords: پرتو یون متمرکز شده; Oxygen diffusion; Surface exchange; Focussed ion beam; SIMS; LaSrMnO3; Perovskite oxide;
Coulomb interactions in a low-voltage focussed ion beam system
Keywords: پرتو یون متمرکز شده; Focussed ion beam; Immersion lens; Booster principle; Coulomb interaction; Monte Carlo simulation
Shaping the lens of the atom probe: Fabrication of site specific, oriented specimens and application to grain boundary analysis
Keywords: پرتو یون متمرکز شده; Atom probe tomography; Grain boundaries; Focussed ion beam; Site specific; Grain boundary segregation
Focussed ion beam–transmission electron microscopy applications in ore mineralogy: Bridging micro- and nanoscale observations
Keywords: پرتو یون متمرکز شده; Focussed ion beam; Transmission electron microscopy; Ore textures; Sphalerite; Cu–Fe-sulphides; Pyrite; Pb–Bi-sulphosalts; (Nano)particles
Petrogenetic significance of Au–Bi–Te–S associations: The example of Maldon, Central Victorian gold province, Australia
Keywords: پرتو یون متمرکز شده; Gold deposits; Bismuth melts; Focussed ion beam; Transmission electron microscopy; Maldonite; Tetradymite group; Remobilisation; Thermodynamic modelling
Nano-cell fabrication on semiconductor utilizing self-organizational behavior of point defects induced by ion beam
Keywords: پرتو یون متمرکز شده; 61.72.Vv; 61.82.Fk; 68.37.Hk; 81.05.Ea; 81.16.Rf; 81.16.-c; 87.17.-d; Focussed ion beam; Void; Self-organization; Ion-implantation; Cellular structure; Nano-fabrication;
Short cracks initiated in Al 6013-T6 with the focused ion beam (FIB)-technology
Keywords: پرتو یون متمرکز شده; Fatigue crack growth; Long cracks; Short corner cracks; Focussed ion beam; Constant Kmax-tests; Prediction model; Threshold; Aluminium alloys
A study of FIB-patterned discrete track recording media by spinstand read/write testing and scanning probe microscopy
Keywords: پرتو یون متمرکز شده; 85.70.Kh; 68.37.Rt; 85.40.Hp; Discrete track recording; Focussed ion beam; Magnetic force microscopy; Magnetic media; Spinstand;
Scanning transmission ion micro-tomography (STIM-T) of biological specimens
Keywords: پرتو یون متمرکز شده; 41.75.Ak; 87.59.FSTIM-T; Focussed ion beam; Tomography; Energy loss projection; Biological specimen; Sub-micron resolution