Keywords: طیف سنجی عکسبرداری معکوس; 2D; Two-Dimensional; 2DEG; Two-Dimensional Electron Gas; 2DPS; Two-Dimensionally-Periodic Slab; 3D; Three-Dimensional; AES; Auger Electron Spectroscopy; AFM; Atomic Force Microscopy; ARUPS; Angle-Resolved Ultraviolet Photoemission Spectroscopy; B3LYP; Bec
مقالات ISI طیف سنجی عکسبرداری معکوس (ترجمه نشده)
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Keywords: طیف سنجی عکسبرداری معکوس; AES; auger electron spectroscopy; AFM; atomic force microscopy; APDBs; antiphase domain boundaries; CEMS; conversion electron Mössbauer spectroscopy; CTR; crystal truncation rod; DBT; distorted bulk truncation; DFT; density functional theory; DFT+U; dens
Electronic structure of stable n-type semiconducting molecular complex (diC8-BTBT)(TCNQ) studied by ultraviolet photoemission and inverse photoemission spectroscopy
Keywords: طیف سنجی عکسبرداری معکوس; Charge transfer complex; Electronic structure; Ultraviolet photoemission spectroscopy; Inverse photoemission spectroscopy; Air-stable n-type semiconductor;
Inverse photoemission and photoemission spectroscopic studies on sputter-annealed Ni-Mn-Sn and Ni-Mn-In surfaces
Keywords: طیف سنجی عکسبرداری معکوس; Inverse photoemission spectroscopy; Photoemission spectroscopy; Full Heusler alloy; Korringa-Kohn-Rostoker method;
Side chain effect on electronic structure of spin-coated films of [6,6]-phenyl-C61-butyric acid methyl ester and its bis-adduct
Keywords: طیف سنجی عکسبرداری معکوس; PCBM; Side chain effect; Ultraviolet photoelectron spectroscopy; Inverse photoemission spectroscopy; Spin-coated film;
Pinning of fullerene lowest unoccupied molecular orbital edge at the interface with standing up copper phthalocyanine
Keywords: طیف سنجی عکسبرداری معکوس; Ultraviolet photoemission spectroscopy; Inverse photoemission spectroscopy; Copper phthalocyanine; Fullerene; Molecular orientation
Growth of stoichiometric TiO2 thin films on Au(100) substrates by molecular beam epitaxy
Keywords: طیف سنجی عکسبرداری معکوس; Titanium oxide; Gold; Epitaxial growth; Rutile (100); X-ray photoelectron spectroscopy; Low-energy electron diffraction; Ultraviolet photoemission spectroscopy; Inverse photoemission spectroscopy
Strong interface p-doping and band bending in C60 on MoOx
Keywords: طیف سنجی عکسبرداری معکوس; Doped fullerene; Electronic structure; Inversion; Organic photovoltaic; Ultraviolet photoemission spectroscopy; Inverse photoemission spectroscopy
Surface Hubbard U of alkali fullerides
Keywords: طیف سنجی عکسبرداری معکوس; Fullerenes; Fullerides; Hubbard U; Photoemission spectroscopy; Inverse photoemission spectroscopy;
Functionalization of flat Si surfaces with inorganic compounds-Towards molecular CMOS hybrid devices
Keywords: طیف سنجی عکسبرداری معکوس; ALD; atomic layer deposition; CEG; cathodic electrografting; CVD; chemical vapor deposition; CV; cyclic voltammetry; ID; drain current; IPES; inverse photoemission spectroscopy; k0; rate of electron transfer; MOSFET; metal-oxide-semiconductor field ef
Unoccupied states in copper phthalocyanine/fullerene blended films determined by inverse photoemission spectroscopy
Keywords: طیف سنجی عکسبرداری معکوس; Donor/acceptor blend; Unoccupied states; Inverse photoemission spectroscopy; Electronic structure; Organic photovoltaics
Electronic structure of anode interface with molybdenum oxide buffer layer
Keywords: طیف سنجی عکسبرداری معکوس; MoO3; Oxygen vacancy; Ultraviolet photoemission spectroscopy; Inverse photoemission spectroscopy
Electronic structures of imidazolium-based ionic liquids
Keywords: طیف سنجی عکسبرداری معکوس; Ionic liquid; Soft X-ray emission spectroscopy; Electronic structure; Photoemission spectroscopy; Inverse photoemission spectroscopy;
Electronic structure of frontier states in an evaporated thin film of a highly amphoteric and polar molecule
Keywords: طیف سنجی عکسبرداری معکوس; Amphotericity; Narrow-gap organic semiconductor; Ultraviolet photoemission spectroscopy; Inverse photoemission spectroscopy
Electronic surface states of Cu(1 1 0) surface
Keywords: طیف سنجی عکسبرداری معکوس; Photoelectron spectroscopy; Inverse photoemission spectroscopy; Reflection spectroscopy; Surface electronic phenomena; Copper;
Electronic structure of oxidized SiC(0 0 0 1) studied by inverse photoemission spectroscopy
Keywords: طیف سنجی عکسبرداری معکوس; Silicon carbide; Oxidation; Inverse photoemission spectroscopy; Surface electronic phenomena;
Surface structure and electronic states of sulfur-treated InP(1Â 1Â 1)A studied by LEED, AES, STM, and IPES
Keywords: طیف سنجی عکسبرداری معکوس; 68.35.âp; 68.35.Bs; 73.20.âr; 73.20.At; Auger electron spectroscopy; Low-energy electron diffraction; Scanning tunneling microscopy; Inverse photoemission spectroscopy; Surface relaxation and reconstruction; Indium phosphide;