Keywords: اندازه گیری ضخامت; Frosting process; Frost thin layer; Surface plasmon resonance (SPR); Thickness measurement;
مقالات ISI اندازه گیری ضخامت (ترجمه نشده)
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Keywords: اندازه گیری ضخامت; Droplet impact; High Weber number; Thin moving films; Thickness measurement; Lamella breakup; Hole formation;
Keywords: اندازه گیری ضخامت; X-ray fluorescence; Thickness measurement; Organic coatings; Metals; Corrosion protection;
Keywords: اندازه گیری ضخامت; Thickness measurement; Ultrasound; Lubricant layer; Wear detection;
Keywords: اندازه گیری ضخامت; Position averaged convergent beam electron diffraction (PACBED); Scanning transmission electron microscopy (STEM); Thickness measurement;
Keywords: اندازه گیری ضخامت; Lithium-ion battery production; Electrode inspection; Active thermography; Thickness measurement; Basis weight measurement;
Keywords: اندازه گیری ضخامت; Graphene; Thickness measurement; Segregation; Chemical reduction; Atomic force microscopy; Ultrasonic force microscopy;
Keywords: اندازه گیری ضخامت; Pulsed eddy current testing; Thickness measurement; Ferromagnetic plate; Corrosion; Electromagnetic field;
Keywords: اندازه گیری ضخامت; Spectroscopic ellipsometry; Optical characterization; Thin films; Optical properties; Thickness measurement; Correlation; Uniqueness; Semiconductor manufacturing;
Keywords: اندازه گیری ضخامت; Water film; Thickness measurement; Infrared radiation; Absorption;
Keywords: اندازه گیری ضخامت; Thickness measurement; Magnetic force microscopy; Atomic force microscopy; Periodic magnetic domains; Bacteria;
Keywords: اندازه گیری ضخامت; Electron holography; Thickness measurement; Interference micrograph; Superconductors;
Keywords: اندازه گیری ضخامت; Ellipsometry; Phase-shifting technique; Thickness measurement; Nanofilm;
Monte Carlo simulation and theoretical calculation of SEM image intensity and its application in thickness measurement
Keywords: اندازه گیری ضخامت; Monte Carlo simulation; Secondary electron; Backscattered electron; Thickness measurement; SEM;
Experimental comparison between performance of the PM and LPM methods in computed radiography
Keywords: اندازه گیری ضخامت; Computed radiography; Primary modulation; Scatter to primary ratio; Thickness measurement;
High temperature EMAT design for scanning or fixed point operation on magnetite coated steel
Keywords: اندازه گیری ضخامت; EMAT; High temperature; Thickness measurement; Magnetostriction;
Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)
Keywords: اندازه گیری ضخامت; Graphene; Thickness measurement; Atomic force microscopy; Histogram method;
Pulsed eddy current thickness measurement using phase features immune to liftoff effect
Keywords: اندازه گیری ضخامت; Pulsed eddy current; Nondestructive testing; Liftoff; Phase; Spectral response; Thickness measurement; Metallic plate;
Absolute thickness measurement of pyrolytic graphite spheroids by STEM-EELS
Keywords: اندازه گیری ضخامت; Graphite spheroid; STEM-EELS; Thickness measurement; Collection semi-angle; Refractive index; Optical property;
Thickness measurement using liftoff point of intersection in pulsed eddy current responses for elimination of liftoff effect
Keywords: اندازه گیری ضخامت; Electromagnetic sensors; Nondestructive testing; Pulsed eddy current; Liftoff point of intersection; Thickness measurement; Liftoff effect;
The experimental electron mean-free-path in Si under typical (S)TEM conditions
Keywords: اندازه گیری ضخامت; EELS; Mean free path; Thickness measurement; Log-ratio method; Si; TEM; STEM;
An SVM approach with electromagnetic methods to assess metal plate thickness
Keywords: اندازه گیری ضخامت; Eddy current testing; ECT; Giant magneto resistance; GMR; Transient eddy current; Pulsed eddy current; Nondestructive testing; Support vector machine; SVM; Thickness measurement
Imaging and measuring methods for coating layer thickness of TRISO-coated fuel particles with high accuracy
Keywords: اندازه گیری ضخامت; TRISO-coated fuel particle; Thickness measurement; X-ray phase contrast imaging; Image denoising; Edge detection
Simultaneous film thickness measurement and wall temperature assessment by Low-Coherence Interferometry
Keywords: اندازه گیری ضخامت; Low-Coherence Interferometry; Falling liquid film; Surface wave; Thickness measurement; Wall temperature assessment
Time–frequency analysis for ultrasonic measurement of liquid-layer thickness
Keywords: اندازه گیری ضخامت; Wavelet transform; Modulus maxima; Liquid layer; Ultrasonic technique; Thickness measurement
A novel method to determine Poisson's ratio by beta-ray absorption experiment
Keywords: اندازه گیری ضخامت; Beta absorption; Thickness measurement; Poisson's ratio
Thickness measurement of a thin hetero-oxide film with an interfacial oxide layer by X-ray photoelectron spectroscopy
Keywords: اندازه گیری ضخامت; 68.55.jd; 77.84.Bw; 79.60.âi; 06.20.Fâ; Thickness measurement; HfO2; XPS; Standard metrology;
A study on reliability-based inspection planning – Application to deck plate thickness measurement of aging tankers
Keywords: اندازه گیری ضخامت; Inspection planning; Time-variant reliability; Thickness measurement; Aging tanker; Deck plate; Ultimate strength; Uncertainty; Monte Carlo simulation; Latin hypercube sampling
Dual-axes differential confocal microscopy with high axial resolution and long working distance
Keywords: اندازه گیری ضخامت; Confocal microscopy; Dual-axes differential confocal microscopy (DDCM); Thickness measurement; Tracing measurement
An X-ray photoelectron spectroscopy study of ultra-thin oxynitride films
Keywords: اندازه گیری ضخامت; Silicon oxynitrides; Thin films; XPS; Thickness measurement; Plasma nitridation;
Quality evaluation for air plasma spray thermal barrier coatings with pulsed thermography
Keywords: اندازه گیری ضخامت; thermal barrier coatings (TBCs); non-destructive evaluation (NDE); pulsed thermography; microstructure; thickness measurement
A thickness measurement technique based on low-coherence interferometry applied to a liquid film with thermal gradient
Keywords: اندازه گیری ضخامت; Low-coherence interferometry; Liquid film; Thickness measurement; Group refractive index; Temperature gradient; Alkanes
Multilayer thin film thickness measurement using sensitivity separation method
Keywords: اندازه گیری ضخامت; Thin films; Thickness measurement; Optical properties; Sensitivity separation
Determination of the thickness of a transparent plate using a reflective fiber optic displacement sensor
Keywords: اندازه گیری ضخامت; Fiber optic sensor; Thickness measurement; Transparent plate
Position averaged convergent beam electron diffraction: Theory and applications
Keywords: اندازه گیری ضخامت; CBED; STEM; Polarity; Thickness measurement
A high-precision measurement technique for evaluating alcohol concentrations using an optical metrology system based on a position sensing detector
Keywords: اندازه گیری ضخامت; Position sensing detector (PSD); Refractive index; Thickness measurement; Alcohol concentration
A spectral interferometric method to measure thickness with large range
Keywords: اندازه گیری ضخامت; Spectral interferometry; Thickness measurement; Large range; Optical path difference42.25.Hz; 07.60.Ly; 42.15.Eq
A PSD-based method for measuring the thickness and refractive index properties of optical plates
Keywords: اندازه گیری ضخامت; Position sensing detector (PSD); Refractive index; Thickness measurement; Birefringence
Parallel angle resolved XPS investigations on 12 in. wafers for the study of W and WSix oxidation in air
Keywords: اندازه گیری ضخامت; XPS; ARXPS; Tungsten; Tungsten silicide; 12 in. Wafers; Oxidation mechanisms; Depth profile; ToF SIMS; Thickness measurement
Effects of step slope on thickness measurement by optical interferometry for opaque thin films
Keywords: اندازه گیری ضخامت; Optical interferometry; Thickness measurement; Step slope
Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometric films
Keywords: اندازه گیری ضخامت; ARXPS; Thickness measurement; Interface; Thin film; MOCVD; TiO2;
A high-precision optical metrology system for determining the thickness of birefringent wave plates
Keywords: اندازه گیری ضخامت; Laser interferometer; Optical path; Refractive index; Thickness measurement; Birefringence
Measuring film thickness using infrared imaging
Keywords: اندازه گیری ضخامت; Thermography; Coatings; Thickness measurement; Surface roughness;
A measurement system for determining the thickness of an optical wave plate
Keywords: اندازه گیری ضخامت; Thickness measurement; Laser interferometer; Optical path difference;