کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10279927 | 465454 | 2005 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Application of charge contrast imaging in mineral characterization
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
مهندسی شیمی (عمومی)
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Charge contrast imaging (CCI) is a new imaging mode in the variable pressure scanning electron microscope (VP-SEM) that allows for the imaging of microstructures in various non-conductive and semi-conductive materials. The exact mechanism for CCI is still debatable; however, it is agreed that there is an optimal charge compensation whereby contrast between high-density and low-density charge traps is accentuated. This phenomenon is not observable with secondary electron and backscattered electron detectors in the conventional high-vacuum SEM. In this paper, optimum operating conditions for CCI are presented for gibbsite and nickel hydroxide. User-friendly methods for finding this optimum contrast are provided as well as the benefits and potential pit-falls of the technique. The work was performed on the Hitachi S3000N VP-SEM, which allows analysis in the high-vacuum and low-pressure (<270 Pa) region.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Minerals Engineering - Volume 18, Issue 3, March 2005, Pages 343-352
Journal: Minerals Engineering - Volume 18, Issue 3, March 2005, Pages 343-352
نویسندگان
K. Robertson, R. Gauvin, J. Finch,