کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10364242 871565 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Temperature and bias investigation of self heating effect and threshold voltage shift in pHEMT's
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Temperature and bias investigation of self heating effect and threshold voltage shift in pHEMT's
چکیده انگلیسی
The output I−V characteristics of our devices are also affected by the threshold voltage shift. It results that the threshold voltage increases linearly by decreasing the temperature. This threshold voltage shift causes a decrease of the transconductance when the devices is biased closer to the pinch-off. Consequently, the forward transmission parameter S21 at microwaves shows a degradation at lower temperatures despite the fact that the transport properties improve upon cooling.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 36, Issue 8, August 2005, Pages 732-736
نویسندگان
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