Positron annihilation spectroscopy for surface and interface studies in nanoscale polymeric films

Positron annihilation spectroscopy (PAS), coupled with a variable mono-energetic positron beam, has been used to investigate surface and interfacial properties in thin polymeric films. Free-volume properties have been measured from ortho-Positronium (o-Ps) lifetime and the S parameter of Doppler broadening of energy spectra from annihilation radiation as a function of the depth and of the temperature in thin polymeric films. Depth profiles of glass transition temperature and nanoscale layered structures in polystyrene (PS) thin films on the Si substrate are presented.