کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10644901 | 999775 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Irradiation-induced disordering and amorphization of Al3Ti-based intermetallic compounds
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی انرژی
انرژی هسته ای و مهندسی
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چکیده انگلیسی
An in situ ion-irradiation study, simultaneously examined using transmission electron microscopy, was performed to investigate irradiation-induced disordering and amorphization of Al3Ti-based intermetallic compounds. Thin foil samples of two crystalline structures: D022-structured Al3Ti and L12-structured (Al,Cr)3Ti were irradiated using 1.0Â MeV Kr ions at a temperature range from 40Â K to 573Â K to doses up to 4.06Â ÃÂ 1015 ions/cm2. The results showed that both the compounds underwent an order-disorder transformation under irradiation, where both Al3Ti and (Al,Cr)3Ti ordered structures were fully transformed to the disordered face-centered cubic (FCC) structure except at the highest irradiation temperature of 573Â K. A slightly higher irradiation dose was required for order-disorder transformation in case of Al3Ti as compared to (Al,Cr)3Ti at a given temperature. However, their amorphization resistances were different: while the disordered FCC (Al,Cr)3Ti amorphized at the irradiation dose of 6.25Â ÃÂ 1014 ions/cm2 (0.92 dpa) at 40Â K and 100Â K, the Al3Ti compound with the same disordered FCC structure maintained crystallinity up to 4.06Â ÃÂ 1015 ions/cm2 (5.62 dpa) at 40Â K. The critical temperature for amorphization of (Al,Cr)3Ti under Kr ion irradiation is likely between 100Â K and room temperature and the critical temperature for disordering between room temperature and 573Â K.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Nuclear Materials - Volume 467, Part 2, December 2015, Pages 601-606
Journal: Journal of Nuclear Materials - Volume 467, Part 2, December 2015, Pages 601-606
نویسندگان
Jeong-Yong Park, Il-Hyun Kim, Arthur T. Motta, Christopher J. Ulmer, Marquis A. Jr., Edward A. Ryan, Peter M. Baldo,