کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10652427 | 1002048 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
0.23Â eV energy resolution obtained using a cold field-emission gun and a streak imaging technique
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
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چکیده انگلیسی
We demonstrate that a high energy resolution of 0.23Â eV is possible by using a cold field-emission electron gun (CFEG) without a monochromator. We have used a 300Â kV transmission electron microscope (Hitachi, HF-3000) equipped with a CFEG and an energy filter (Gatan, GIF2002). Since energy instability is critical for high energy resolution in electron energy-loss spectroscopy, we have applied a high-speed 'streak imaging' acquisition technique, in which a series of time-resolved spectra are acquired as a two-dimensional spectrum. With this technique, we can easily record 1000-20,000 spectra with an exposure time of 0.353Â ms per spectrum. Instability of less than 1.4Â kHz has been corrected in the time-resolved spectra, allowing the inherent performance of the CFEG to be realized.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 36, Issue 5, July 2005, Pages 465-469
Journal: Micron - Volume 36, Issue 5, July 2005, Pages 465-469
نویسندگان
Koji Kimoto, Kazuo Ishizuka, Toru Asaka, Takuro Nagai, Yoshio Matsui,