The influence of barrier layers (SiO2, Al2O3, W) on the phase formation and stability of RuAl thin films on LGS and CTGS substrates for surface acoustic wave technology

The influence of barrier layers (SiO2, Al2O3, W) on the phase formation and stability of RuAl thin films on LGS and CTGS substrates for surface acoustic wave technology

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 688, Part A, 15 December 2016, Pages 228-240

Marietta Seifert, Gayatri K. Rane, Siegfried B. Menzel, Thomas Gemming,