Microstructural evolution and magnetic properties in Fe50Pd50 sputtered thin films submitted to post-deposition annealing

MFM images acquired at magnetisation remanence in the perpendicular configuration of selected annealed Fe50Pd50 thin films: (a) Ta = 575 °C; (b) Ta = 590 °C; (c) Ta = 600 °C and (d) Ta = 625 °C.