Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction

► We present a novel analysis method utilising robust fitting to relate HR-EBSD measurements to lattice strains and rotations. ► We demonstrate this analysis method using both simulated EBSPs and experimental patterns from deformed copper. ► In the simulated EBSPs demonstration, we show that the analysis enables reliable measurement of lattice rotations from ±8° up to ±11°. ► With the deformed copper example, we reveal a structure containing cell block boundaries.