کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10672656 1009966 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effect of tip shape on capacitance determination accuracy in scanning capacitance microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Effect of tip shape on capacitance determination accuracy in scanning capacitance microscopy
چکیده انگلیسی
The stray electrostatic field causes large errors, which are exceptionally severe with microfabricated probes. Contrary to general belief, differential measurements, based on modulation of the probe/sample separation or of the width of depletion layer in semiconductors, do not reduce the effect of the stray field significantly. For best results, the probe should be shielded as close to the tip apex as possible. In the case of microfabricated probes, at least the side of the cantilever facing the sample should be shielded.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 103, Issue 3, June 2005, Pages 221-228
نویسندگان
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