کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10707765 | 1023779 | 2005 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The effect of deposition temperature and RF power on the electrical and physical properties of the MgTiO3 thin films
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: The effect of deposition temperature and RF power on the electrical and physical properties of the MgTiO3 thin films The effect of deposition temperature and RF power on the electrical and physical properties of the MgTiO3 thin films](/preview/png/10707765.png)
چکیده انگلیسی
MgTiO3 thin films were grown on Si(1 0 0) substrate by radio frequency (RF) magnetron sputtering. The microstructure and the surface morphology of MgTiO3 thin film have been studied by X-ray diffraction (XRD) and atomic force microscopy (AFM). The XRD showed that the deposited films exhibited a polycrystalline microstructure. The grain size of the film increased with an increase in the RF power and substrate temperature. The electrical properties were measured using capacitance-voltage and current-voltage measurements on metal-insulator-semiconductor (MIS) capacitor structures. At a Ar/O2 ratio of 100/0, RF power of 400 W and substrate temperature of 400 °C, the MgTiO3 films with 6 μm thickness possess a dielectric constant of 16.2 (f=10MHz), a leakage current density of 10â9 A/mm2.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 285, Issue 4, 15 December 2005, Pages 586-594
Journal: Journal of Crystal Growth - Volume 285, Issue 4, 15 December 2005, Pages 586-594
نویسندگان
Cheng-Liang Huang, Yuan-Bin Chen,