کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1254513 | 971378 | 2014 | 6 صفحه PDF | دانلود رایگان |
Thin films of Cu2−xS (x = 0, 1) were deposited on self-assembled, monolayer modified substrates in the copper–thiosulfate system with various concentrations of ethylene diamine tetraacetic acid (EDTA) at a low temperature of 70 °C. The thin films were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscope (XPS), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM). The optical and photoelectrochemical (PEC) properties of the Cu2−xS semiconductor films were investigated by ultraviolet–visible (UV–vis) absorption spectroscopy and a three-electrode system. It is found that EDTA plays a key role in the process of Cu2−xS nanocrystals formation and growth. The compositions of the Cu2−xS nanocrystals varied from Cu2S (chalcocide) to CuS (covellite) through adjusting the concentration of EDTA, which is used as a complexing agent to yield high-quality Cu2−xS films. The growth mechanisms of Cu2−xS nanocrystals with different EDTA concentrations are proposed and discussed in detail.
The molar ratio between EDTA and CuSO4·5H2O is shown to greatly affect the shape and size of Cu2−xS nanocrystals.Figure optionsDownload as PowerPoint slide
Journal: Chinese Chemical Letters - Volume 25, Issue 11, November 2014, Pages 1473–1478