کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1295310 | 1498392 | 2007 | 5 صفحه PDF | دانلود رایگان |
The relationship between electrical conduction and dielectric relaxation was investigated for 20 at.% Sm doped CeO2 (Ce0.8Sm0.2O2−δ), which is a typical oxide-ion conductor. Numerical calculation clarified that the anomalously large dielectric constant (εr′) originated from the superimposition of both Debye-type polarization and interfacial polarization between electrolyte and electrode. Two kinds of the Debye-type relaxation appeared at and above 673 K, which were assigned to defect associates, (SmCe′–VO) and (SmCe′–VO–SmCe′)x. The Debye-type polarization was also confirmed by analyzing the dielectric loss factor (εrʺ). Ac conductivity (σac) in high temperature and high frequency regions agreed with dc conductivity (σdc), while the dispersion of σac was ascribed to the Debye-type polarizations.
Journal: Solid State Ionics - Volume 178, Issues 13–14, 31 May 2007, Pages 889–893