Characterisation and ac-electrical investigation of sublimated bis(dimethylglyoximato)palladium(II) thin films

Bis(dimethylglyoximato)palladium(II) complex of chemical formula Pd(C4H7N2O2)2 with structure shown bellow, was prepared in form of thin film on p-Si substrate by sublimation method. Samples were characterised by X-ray diffraction and fluorescence. Their dielectric properties were studied as a function of frequency.