Dielectric properties of Sr1−XBi2+(2/3)X(VXNb1−X)2O9 [X = 0.1 and 0.2] ceramics

The results of systematic studies on the dielectric properties of Sr1−XBi2+(2/3)X(VXNb1−X)2O9 [X = 0.1 and 0.2] ferroelectric ceramics are reported. X-ray diffraction (XRD) studies on Sr1−XBi2+(2/3)X(VXNb1−X)2O9 with X = 0.1 revealed that the single-phase layered perovskites was formed without any detectable secondary phase. However, with X = 0.2 in addition to the major layered perovskite phase, a minor unknown phase was noticed. An enhancement in the dielectric properties of SrBi2Nb2O9 (SBN) was observed with the increase in partial substitution of pentavalent niobium ions (0.68 Å) by smaller pentavalent vanadium ions (0.59 Å) in the B sites along with the deficiency of strontium ions in the A site.