کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1498909 1510932 2012 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Comment on: Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Comment on: Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques
چکیده انگلیسی

Copper sub-micron films are structured as columnar arrays of grains and are virtual two-dimensional polycrystalline solids. By modelling their plastic deformation by a two-dimensional flow of sliding deformable grains, a new perspective of the mechanical tests of Gruber et al. [Acta Mater. 56 (2008) 2318] is attained that reveals remarkable regularities which are missed by the more conventional analysis of the authors. The model shows that two-dimensional plasticity has significant qualitative differences from the three-dimensional counterpart.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 67, Issues 7–8, October 2012, Pages 736–739
نویسندگان
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