کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1530187 | 1511989 | 2010 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Nanostructure and strain analysis of CeO2/YSZ strained superlattice
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In this study, the nanostructure and the strain fields in the superlattice [CeO2/YSZ]5 fabricated on the SiO2/Si(0Â 0Â 1) substrate were investigated macroscopically and nanoscopically using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) and related methods. The XRD analyses elucidated that the out-of-plane lattice parameter of CeO2 and YSZ layers is relaxed. However, the in-plane lattice parameter is almost identical. Results of HRTEM and related analyses revealed that CeO2 and YSZ layers form a superlattice structure. Results show that the superlattice has some defect structure, such as misorientation, varied thickness of CeO2 and YSZ layers, varied artificial periodicity, and interface roughness. However, the out-of-plane lattice parameter has periodicity corresponding to the superlattice structure. The in-plane lattice parameter is also equal to the local deviation. Therefore, the strain effect in the superlattice persists to some degree.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 173, Issues 1â3, 15 October 2010, Pages 220-228
Journal: Materials Science and Engineering: B - Volume 173, Issues 1â3, 15 October 2010, Pages 220-228
نویسندگان
Takanori Kiguchi, Toyohiko J. Konno, Naoki Wakiya, Hitoshi Morioka, Keisuke Saito, Kazuo Shinozaki,