Keywords: تجزیه و تحلیل فاز هندسی; Interplanar spacing; Nanomaterials; Geometric phase analysis; Transmission electron microscopy;
مقالات ISI تجزیه و تحلیل فاز هندسی (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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Keywords: تجزیه و تحلیل فاز هندسی; Geometric phase analysis; Windowed Fourier transform; Soft UV-NIL
Linking sintering stresses to nano modification in the microstructure of BaLa4Ti4O15 by transmission electron microscopy
Keywords: تجزیه و تحلیل فاز هندسی; Stress; Sintering; Barium lanthanum titanate; High resolution transmission electron microscopy; Microstructure; Geometric phase analysis;
Ordered misfit dislocations in epitaxial Gd doped CeO2 thin films deposited on (001)YSZ single crystal substrates
Keywords: تجزیه و تحلیل فاز هندسی; Misfit dislocations; Gadolinium doped ceria; Geometric phase analysis; Monte Carlo simulation;
Electron-irradiation induced defects in Yb2Ti2.05O7
Keywords: تجزیه و تحلیل فاز هندسی; Irradiation; Pyrochlore; Dislocation; STEM; Geometric phase analysis;
Interfacial properties of self-assembled GaN nanowires on pre-processed Al2O3(0001) surfaces
Keywords: تجزیه و تحلیل فاز هندسی; High-resolution transmission electron microscopy (HRTEM); Quantitative HRTEM analysis; Geometric phase analysis; Sapphire substrate; GaN Nanowires; Catalyst-free growth;
Subset geometric phase analysis method for deformation evaluation of HRTEM images
Keywords: تجزیه و تحلیل فاز هندسی; High resolution electron microscopy image; Geometric phase analysis; Strain analysis; Subset;
Influence of defects and nanoscale strain on the photovoltaic properties of CdS/CdSe nanocomposite co-sensitized ZnO nanowire solar cells
Keywords: تجزیه و تحلیل فاز هندسی; ZnO nanowire; CdS/CdSe nanocomposites; Geometric phase analysis; Quantum dot solar cell; Nanoscale strain;
The strain models of complex misfit dislocations at α-Fe2O3/α-Al2O3 interface
Keywords: تجزیه و تحلیل فاز هندسی; Sapphire; Misfit dislocation; Strain distributions; Geometric phase analysis; Dislocation density tensor analysis;
Strain analysis of misfit dislocations in α-Fe2O3/α-Al2O3 heterostructure interface by geometric phase analysis
Keywords: تجزیه و تحلیل فاز هندسی; Sapphire; Misfit dislocation; Strain; Transmission electron microscopy; Geometric phase analysis
Strain study of gold nanomaterials as HR-TEM calibration standard
Keywords: تجزیه و تحلیل فاز هندسی; High resolution electron microscopy; Geometric phase analysis; Strain; Interplanar spacing; Gold thin film;
Investigation of misfit dislocations in α-Fe2O3/α-Al2O3 interface by geometric phase analysis and dislocation density tensor analysis
Keywords: تجزیه و تحلیل فاز هندسی; Sapphire; Misfit dislocation; Transmission electron microscopy; Geometric phase analysis; Dislocation density tensor analysis;
STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials
Keywords: تجزیه و تحلیل فاز هندسی; Quantitative electron microscopy; Geometric phase analysis; STEM-HAADF
Quantitative strain analysis of misfit dislocations in a Ge/Si heterostructure interface by geometric phase analysis
Keywords: تجزیه و تحلیل فاز هندسی; Misfit dislocation; Strain; Heterostructure; Geometric phase analysis
Experimental examination of strain field within GP zone in an Al–Zn–Mg–Cu alloy
Keywords: تجزیه و تحلیل فاز هندسی; Aluminum alloy; GP zone; Microstructure; Electron microscopy; Geometric phase analysis
In-situ SEM investigation of sub-microscale deformation fields around a crack-tip in silicon
Keywords: تجزیه و تحلیل فاز هندسی; Crack-tip; Strain; In-situ; SEM; Geometric phase analysis;
Study of coherence strain of GP II zones in an aged aluminum composite
Keywords: تجزیه و تحلیل فاز هندسی; Geometric phase analysis; High resolution transmission electron microscope; Strain mapping; Precipitation;
Identification of atomic steps at AlSb/GaAs hetero-epitaxial interface using geometric phase method by high-resolution electron microscopy
Keywords: تجزیه و تحلیل فاز هندسی; Geometric phase analysis; Semiconductors; Defects; High-resolution electron microscopy
Reliability of the CFTM and GPA methods for strain analysis at ultra-thin layers
Keywords: تجزیه و تحلیل فاز هندسی; High-resolution transmission electron microscopy; Geometric Phase Analysis; Computational Fourier Transform Moiré; Ultra-thin layers;
Measurement of strain fields in an edge dislocation
Keywords: تجزیه و تحلیل فاز هندسی; Dislocations; Strain; High-resolution electron microscopy; Geometric phase analysis
Nanoscale deformation analysis of a crack-tip in silicon by geometric phase analysis and numerical moiré method
Keywords: تجزیه و تحلیل فاز هندسی; Crack-tip; Strain; Geometric phase analysis; Numerical moiré method; High-resolution transmission electron microscopy
Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
Keywords: تجزیه و تحلیل فاز هندسی; Metal/ceramic interfaces; HRTEM; Misfit dislocation; Geometric phase analysis;
Residual stress assessment of interconnects by slot milling with FIB and geometric phase analysis
Keywords: تجزیه و تحلیل فاز هندسی; Residual stress; Interconnects; Focused ion-beam; Geometric phase analysis; Finite element method
Nanostructure and strain analysis of CeO2/YSZ strained superlattice
Keywords: تجزیه و تحلیل فاز هندسی; YSZ; Ceria; Superlattice; Strain; Geometric phase analysis; Transmission electron microscopy;
Experimental examination of displacement field in an edge dislocation core in aluminum
Keywords: تجزیه و تحلیل فاز هندسی; Dislocations; Aluminum; High-resolution electron microscopy; Geometric phase analysis
Quantitative measurement of deformation field around low-angle grain boundaries by electron microscopy
Keywords: تجزیه و تحلیل فاز هندسی; 61.72.Ff; 61.72.Mm; 62.20.F−; 68.37.OgGrain boundaries; Electron microscopy; Deformation; Dislocation; Geometric phase analysis
Experimental examination of displacement and strain fields in an edge dislocation core
Keywords: تجزیه و تحلیل فاز هندسی; Dislocations; Displacement; Strain; High-resolution electron microscopy; Geometric phase analysis
Effects of strain gradients on strain measurements using geometrical phase analysis in the transmission electron microscope
Keywords: تجزیه و تحلیل فاز هندسی; Strained Si; Geometric phase analysis; Local strain measurement