کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1531347 | 1512005 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Ge quantum-dot polysilicon emitter heterojunction phototransistors for 1.31-1.55 μm light detection
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
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چکیده انگلیسی
A Si/SiGe HBT-type phototransistor with 10 Ge-dot layers (8ML in each layer, separated by 30 nm Si spacer) incorporated in the base-collector junction was grown by UHV-CVD. To achieve low dark current density and high photo-responsivity, a high-low emitter profile consisting of a heavily doped polysilicon contact on top of a thin epitaxial emitter cap has been fabricated. At room temperature, I-V measurement showed a low dark current density of 3 Ã 10â5 A/cm2 at 3 V. The measured breakdown voltage BVceo was about 12 V. A photo-responsivity of 1.94 and 0.028 mA/W was achieved at 1.31 and 1.55 μm for normal incidence, respectively. Compared to a p-i-n reference detector with the same quantum-dot layer, the responsivity is improved by a factor of 45 and 20 at 1.31 and 1.55 μm, respectively.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 147, Issues 2â3, 15 February 2008, Pages 187-190
Journal: Materials Science and Engineering: B - Volume 147, Issues 2â3, 15 February 2008, Pages 187-190
نویسندگان
Rongshan Wei, Ning Deng, Hao Dong, Min Ren, Lei Zhang, Peiyi Chen, Litian Liu,