Measurement of properties of silver telluride thin films using holography

Holography is an interferometric method of recording the light waves diffracted by a subject illuminated with coherent light. Holographic interferometry (H.I.) is one of the most important applications of holography. It is concerned with the formation and interpretation of fringe patterns, which appears when a wave generated at some earlier time and stored in a hologram is later reconstructed by interfering with comparison wave. We report a technique, which uses double exposure holographic interferometry together with simple mathematical interpretation, which allow immediate finding of stress and thickness of thin film. We tested the same for different normalities of solutions. It was further noticed that the fringe spacing changes with solution concentration as well as time of deposition. The thin films are prepared using electrodeposition technique. It’s structural, morphological and optical study carried out by XRD, SEM, and UV–Vis–NIR spectrophotometer.