کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1565598 | 1514206 | 2013 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Toughness characterization by small specimen test technique for HIPed joints of F82H steel aiming at first wall fabrication in fusion
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی انرژی
انرژی هسته ای و مهندسی
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چکیده انگلیسی
Reduced activation ferritic/martensitic steels (RAFMs), such as F82H steels, have been developed as candidates of structural materials for fusion. In the design of a fusion reactor, cooling channels are built in the first wall of the blanket. One large issue is to determine how to join rectangular tubes to thin panels to fabricate the first wall. Hot Isostatic Pressing (HIPing) is a solution to solve the issue. Because of the thin HIPed walls of the channels, the specimen size for inspection of HIPed interface is limited. In the present research, Small Specimen Test Techniques (SSTT) are screened for the destructive toughness investigation technique of HIPed F82H joints. 1/3 size Charpy V-notch impact (1/3 CVN) and small punch (SP) tests are employed for the present research. The toughness of the HIPed joints is strongly affected by various surface finishing of specimens treated previous to the HIPing. In the present research, several kinds of HIPed joints were surface finished by different methods and investigated by 1/3 CVN impact test. The HIPed F82H joints had different toughness ranging from 20% to 70% of the toughness of the F82H base metal. The SP test is also available for the investigation of toughness change by the HIPing. The sensitivity of 1/3 CVN impact test against toughness change was better than the SP test, it revealed that the SP test has some limitations.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Nuclear Materials - Volume 440, Issues 1â3, September 2013, Pages 622-626
Journal: Journal of Nuclear Materials - Volume 440, Issues 1â3, September 2013, Pages 622-626
نویسندگان
H. Kishimoto, T. Ono, H. Sakasegawa, H. Tanigawa, Y. Kohno, A. Kohyama,