Heavy-ion irradiation defect accumulation in ZrN characterized by TEM, GIXRD, nanoindentation, and helium desorption

A study on zirconium nitride was performed to assess the effect of radiation damage by heavy ions at cryogenic and elevated temperatures. Cross-sectional transmission electron microscopy, grazing incidence X-ray diffraction, nanoindentation, and helium desorption studies were used to assess the damage and its effects. Xenon and krypton were used as heavy ions at 300 keV to displacement damage as high as 200 dpa. Implants were cryogenic, 350 °C, 580 °C, and 800 °C. Amorphization was not observed at low temperatures nor was bubble formation observed at elevated temperatures, however, defect migration was observed at elevated temperatures. Nanoindenter results showed the onset of defect saturation. Helium release studies were performed to show the effect of increasing damage by Xe to 40 dpa.