Nuclear reaction analysis with ion microbeam of cross sections of surface layers deposited in a tokamak divertor

Ion micro beam analysis has been applied to the investigation of plasma deposited layers covering the divertor tiles in the JET tokamak. Since the layers are about 100 μm thick they are too thick to be completely investigated by ordinary ion beam analysis. Cross sections of the layers were prepared by cutting and polishing. Elemental depth profiles were determined from the two dimensional images that could be derived by nuclear reaction analysis and resonant backscattering spectrometry, using ion beams focused to a few μm spot size. A combination of analysis methods are shown, which allow measurements of the concentration profiles of carbon, beryllium, deuterium, oxygen and stainless steel components at levels of a few percent, with an accuracy better than 10%.