کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1589389 | 1001989 | 2012 | 5 صفحه PDF | دانلود رایگان |
The performance of the high-resolution electron microscope has continued to evolve, with recent developments in hardware attachments enabling aberration correction to be directly achieved for both probe-corrected and image-corrected microscope geometries. Sub-Ångstrom resolution, once regarded as an unattainable dream, can nowadays be readily achieved with instruments that are being widely sold commercially. These instrumentation developments have played a central role in facilitating transformational advances in imaging (and analytical) capability, bringing both novel opportunities and fresh challenges for the electron microscopy community. This paper provides a short update of recent progress in atomic-resolution TEM and STEM imaging, and briefly discusses some of the associated issues and problems attracting close attention.
► Update of progress in atomic-resolution TEM and STEM imaging.
► Hardware attachments enable probe-corrected and image-corrected microscopes.
► Sub-Ångstrom resolution is readily achieved with commercially available instruments.
► Transformational advances bring novel opportunities and fresh challenges.
Journal: Micron - Volume 43, Issue 4, March 2012, Pages 504–508