Determination of the residual stress depth profile of uniaxial compacted ruthenium powder samples by X-ray diffraction

Ruthenium samples with a cylindrical shape have been prepared by means of the Spark-Plasma-Sintering (SPS) process at sintering temperatures between 1200 °C and 1600 °C and a corresponding sintering time of 1 min. Similar samples were obtained by conventional hot-pressing process methods at 1200 °C and 1400 °C for 60 min. The residual stress components σ11 and σ33 directed parallel and vertical to the compaction axis have been determined on the plane terminal face of these samples by means of the grazing incidence sin2ψ method. The variation of the angle of incidence between 1° and 10° permitted diffraction measurements at a mean depth of X-ray penetration up to 0.6 μm. The depth profiles of the residual stress were subsequently deduced.