Local structure study of the Ni nanoparticles embedded in SiO2 by ion implantation

The extended x-ray absorption fine structure (EXAFS) and the Atomic force microscopy (AFM) have been used to study the local structural information of Ni nanoparticles implanted into glass. Three different concentrations of nickel nanoparticle samples were fabricated by metal vapor vacuum arc (MEVVA) source on amorphous silicon dioxide substrate at room temperature. With the increase of Ni ion implantation, the interatomic distance and the nearest neighbor coordination number of the nearest Ni-Ni bond and Ni-O bond of nickel nanoparticle presents certain regular change.