کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1609672 | 1516259 | 2015 | 7 صفحه PDF | دانلود رایگان |
NPs-Cu/SiO2 multilayer films were deposited alternately by magnetron sputtering on single silicon and Corning glass substrate with different Cu target power at room temperature (RT) and 400 °C. The structure of the NPs-Cu/SiO2 films was analyzed by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The optical absorption property was investigated by Ultraviolet–visible spectroscopy (UV–Vis). The results of XRD and TEM indicate that Cu nanoparticles are basically spherical and disperse in the SiO2 matrix. The optical absorption peaks due to the surface plasmon resonance (SPR) of Cu nanoparticles are observed in the wavelength range of 590–650 nm. The SPR peak for NPs-Cu/SiO2 multilayer films shows the red-shift trend with increasing Cu target power, however, the SPR peak shows the blue-shift trend with increasing the substrate temperature and the number of Cu layers.
Journal: Journal of Alloys and Compounds - Volume 634, 15 June 2015, Pages 281–287